Transmission Electron Microscope

JEOL 2010F Transmission Electron Microscope

This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, with the ability to image lattice fringes at 0.14 nm resolution. It is a multipurpose ultrahigh resolution analytical electron microscope with a wide range of capabilities such as high-resolution image observation, nanoarea X-ray analysis, versatile analysis by convergent-beam electron diffraction, and analysis of the atomic structure and/or bonding state of atoms. With the addition of Energy dispersive X-ray spectrometer (EDS) and Parallel electron energy loss spectrometer (PEELS), the field-emission TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 2 nm in diameter.

Transmission Electron Microscope
  • 200 kV, Schottky Field Emission Gun
  • Ultra High Resolution Pole Piece (Cs=0.5 mm)
  • 0.19 nm Point-to-Point Resolution
  • Minimum Beam Size: 0.5 nm
  • JEOL Single Tilt Low Background Holder
  • JEOL Double Tilt Low Background Holder
  • Double Tilt Heating Holder (Maximum Temperature: 1000ºC)
  • Specimen Tilt Angle (X axis): ±20º
  • High Resolution Imaging
  • Convergent Beam Electron Diffraction (CBED)
  • Energy Dispersive X-Ray Analysis (EDS)
  • Electron Energy Loss Spectroscopy (EELS)