Materials Characterization

Bruker D2 Phaser Powder X-ray Diffractometer (PXRD)

The Bruker D2 PHASER Powder X-ray Diffractometer provides rapid and reliable structural characterization of crystalline and polycrystalline materials. The instrument can be used for phase identification, crystal structure analysis, evaluation of crystallinity, and detection of phase transformations or impurities. Its compact configuration and straightforward sample handling make it well suited for routine powder XRD measurements across a wide range of materials, including inorganic compounds, minerals, ceramics, catalysts, and other crystalline materials.

Bruker D8 ADVANCE X-ray Diffractometer (PXRD)

The Bruker D8 ADVANCE Powder X-ray Diffractometer provides versatile structural and phase characterization for powders, thin films, and bulk materials. The system can be used for phase identification, crystal structure analysis, evaluation of crystallinity and preferred orientation, and investigation of phase transformations and other structural changes.The MCC system is equipped with multiple interchangeable stages and accessories to support a broad range of measurement geometries and operando/in-situ experiments. A rotation stage is available for routine powder diffraction and selected in-situ measurements, while the cradle stage supports powder and thin-film characterization, including grazing-incidence X-ray diffraction (GIXRD) and X-ray reflectivity (XRR). The system also includes a high-temperature MTC stage for temperature-dependent and in-situ measurements from room temperature to 1300 °C under vacuum, air, or inert-gas environments.With its flexible configuration, the D8 ADVANCE supports both routine diffraction analysis and advanced studies of materials under controlled temperature, atmosphere, and other application-relevant conditions, making it particularly useful for monitoring structural and phase changes as they occur.

Thermo Fisher Scientific K-Alpha X-ray Photoelectron Spectroscopy (XPS)

The Thermo Fisher Scientific K-Alpha X-ray Photoelectron Spectrometer (XPS) provides surface-sensitive elemental and chemical-state characterization of solid materials. The system can be used to identify elements present at the surface, determine their chemical states, and investigate changes in surface composition resulting from processing, reactions, coatings, or environmental exposure.

The MCC system supports high-resolution monochromated XPS, sputter depth profiling, and angle-resolved XPS (ARXPS) for studying composition and chemical-state variations with depth. It is also equipped with a vacuum transfer module, allowing air-sensitive samples to be transferred from a glove box to the instrument with minimized exposure to ambient conditions.

The K-Alpha is well suited for thin films, coatings, catalysts, semiconductors, battery materials, polymers, metals, oxides, and other materials where surface chemistry and near-surface composition are important.

Bruker JPK NanoWizard PURE Atomic Force Microscopy (AFM)

The Bruker JPK NanoWizard PURE Atomic Force Microscope (AFM) provides high-resolution imaging and nanoscale characterization of surface morphology, mechanical properties, and local interactions. The system supports multiple imaging and force-measurement modes, including AC mode imaging, contact mode imaging, PeakForce Tapping, Quantitative Imaging (QI), SmartMapping, magnetic force microscopy (MFM), contact-mode force spectroscopy, and force mapping.

These capabilities enable characterization of surface topography, roughness, adhesion, deformation, mechanical response, magnetic domains, and other local material properties. With precise force control and compatibility with ambient and liquid environments, the NanoWizard PURE is well suited for a wide range of materials, including polymers, nanomaterials, biomaterials, biological samples, and other soft or delicate systems.

Horiba XploRA Micro-Raman Spectrometer (Raman)

The HORIBA XploRA Micro-Raman Spectrometer provides non-destructive, spatially resolved chemical and structural characterization by integrating Raman spectroscopy with optical microscopy. The system can be used for material identification, phase analysis, characterization of molecular bonding and crystal structure, evaluation of crystallinity, and investigation of compositional or structural variations.

The instrument is equipped with 532 nm and 638 nm excitation lasers, providing flexibility for optimizing Raman signal and minimizing fluorescence for different types of samples. In addition to single-point spectral analysis, the XploRA supports Raman mapping to visualize the spatial distribution of chemical components and phases within heterogeneous materials. The system is suitable for a broad range of samples, including polymers, carbon materials, semiconductors, minerals, ceramics, pharmaceuticals, particles, thin films, and other organic and inorganic materials.

Bruker VERTEX 80v Fourier-Transform Infrared spectroscopy (FTIR)

The Bruker VERTEX 80v Fourier-Transform Infrared (FTIR) Spectrometer provides high-sensitivity vibrational spectroscopy for chemical and structural characterization across a broad spectral range extending from far-IR/THz through mid-IR to near-IR. FTIR analysis can be used to identify functional groups, investigate molecular bonding and chemical composition, monitor chemical reactions and structural changes, and compare materials based on their characteristic infrared absorption spectra.

The system features a fully evacuable optical bench, which minimizes interference from atmospheric water vapor and carbon dioxide and improves spectral stability and sensitivity. It is equipped with an ATR accessory for convenient analysis of solids, powders, films, and liquids with minimal sample preparation.

The VERTEX 80v is also integrated with a Bruker HYPERION 3000 FTIR microscope, enabling spatially resolved infrared analysis in both transmission and reflection modes. This combination supports characterization of microscopic features, particles, thin films, coatings, heterogeneous materials, and localized chemical variations across a sample.

Micromeritics AutoChem II 2920 Chemisorption Analyzer

The Micromeritics AutoChem II 2920 Chemisorption Analyzer provides quantitative characterization of chemically active surfaces and catalytic materials. The system can be used to investigate surface active sites, metal dispersion, metal surface area, average crystallite size, and adsorption or reaction behavior under controlled gas environments.

The instrument supports a range of temperature-programmed and pulse chemisorption techniques, including temperature-programmed reduction (TPR), oxidation (TPO), and desorption (TPD), as well as pulse chemisorption measurements. These methods can be used to study catalyst reducibility, oxidation behavior, adsorption strength, active-site density, and surface reactions.

The AutoChem II can also be coupled with mass spectrometry for in-situ analysis of gases released or consumed during chemisorption and temperature-programmed experiments. The system is particularly well suited for catalysts and related materials used in applications such as fuel-cell and reforming research, catalytic cracking, partial oxidation, hydrocracking, isomerization, and Fischer–Tropsch synthesis.

NETZSCH Differential Scanning Calorimeter (DSC) 214 Polyma

The NETZSCH DSC 214 Polyma Differential Scanning Calorimeter (DSC) provides sensitive thermal analysis for studying phase transitions and heat-related material properties. The instrument can be used to determine glass transition temperature, melting and crystallization behavior, enthalpy changes, curing reactions, thermal history, and other thermal transitions.

Equipped with liquid nitrogen (LN₂) cooling, the system operates over a broad temperature range from approximately –170 °C to 600 °C, enabling characterization of both low- and high-temperature transitions. Its fast-response furnace also supports rapid heating and cooling programs for investigating material behavior under different thermal histories and processing conditions.

The DSC 214 Polyma is particularly well suited for polymers and polymer-based materials, while also supporting a wide range of organic and inorganic samples. Applications include material identification, evaluation of crystallinity, comparison of formulations, investigation of curing and reaction behavior, and assessment of changes resulting from processing or aging.

NETZSCH Simultaneous Thermal Analysis (STA) 449 F1 Jupiter

The NETZSCH STA 449 F1 Jupiter Simultaneous Thermal Analyzer (STA) combines thermogravimetric analysis (TGA) and differential scanning calorimetry (DSC), enabling simultaneous measurement of mass changes and heat-flow behavior during controlled heating and cooling. The instrument can be used to investigate thermal stability, decomposition, oxidation, phase transitions, melting and crystallization, reaction behavior, and changes in material composition.

The MCC system operates from room temperature to 1100 °C and supports measurements under controlled inert and oxidizing atmospheres. It can also be coupled with quadrupole mass spectrometry (QMS) for evolved-gas analysis, allowing thermal events and mass-loss steps to be correlated with gases released from the sample.

The instrument is suitable for a broad range of materials, including polymers, ceramics, catalysts, minerals, metals, composites, and other organic and inorganic materials. Applications include thermal stability and decomposition studies, oxidation behavior, phase transformations, reaction mechanisms, compositional analysis, and evolved-gas characterization.

TA Instruments Discovery Dynamic Mechanical Analyzer (DMA) 850

The TA Instruments Discovery DMA 850 Dynamic Mechanical Analyzer (DMA) provides sensitive characterization of the viscoelastic and mechanical properties of materials as a function of temperature, frequency, time, and applied deformation. The instrument can be used to measure storage modulus (E′), loss modulus (E″), tan δ, stiffness, and other mechanical responses, providing insight into molecular mobility, relaxation behavior, and structure–property relationships.

Equipped with liquid nitrogen (LN₂) cooling, the MCC system supports measurements over a broad temperature range from approximately −160 °C to 600 °C. The instrument is particularly useful for studying polymers, elastomers, composites, films, fibers, coatings, and other materials whose mechanical behavior changes with temperature, frequency, processing, or aging.

Capabilities

• Temperature- and frequency-dependent viscoelastic characterization
• Measurement of storage modulus (E′), loss modulus (E″), and tan δ
• Determination of glass transition and secondary relaxation temperatures
• Temperature and frequency sweeps
• Stress and strain sweeps
• Creep and creep-recovery measurements
• Stress relaxation measurements
• Time–temperature superposition

Available Sample Configurations

• Tension: suitable for films, fibers, thin polymer strips, and other flexible specimens
• Single Cantilever: clamped bending configuration suitable for polymers, elastomers, composites, and other self-supporting materials
• Dual Cantilever: clamped bending configuration suitable for polymers, elastomers, thermosets, composites, and other materials requiring sensitive viscoelastic characterization

General Sample Requirements

Samples should have uniform dimensions, smooth and parallel surfaces where applicable, and sufficient mechanical integrity to be mounted securely in the selected fixture. Appropriate sample dimensions depend on the testing mode and material properties. Users are encouraged to consult MCC staff before preparing samples, particularly for unusual geometries, very soft materials, or limited sample quantities.

Agilent Cary 60 UV-VIS Spectrometer (UV-Vis) 

The Agilent Cary 60 UV-Vis Spectrophotometer provides rapid and reliable ultraviolet–visible absorption measurements for chemical, optical, and materials characterization. The instrument operates over a wavelength range of 190–1100 nm and uses a xenon flash lamp with double-beam optics for stable, high-speed spectral acquisition.

The MCC system supports conventional solution measurements as well as solid-sample transmission and fiber-optic measurements, providing flexibility for a broad range of sample types and experimental configurations. The instrument can be used to measure absorbance, transmittance, concentration, reaction kinetics, and wavelength-dependent optical behavior, as well as to investigate electronic transitions and optical properties of materials.

The Cary 60 is well suited for solutions, thin films, polymers, nanoparticles, dyes, semiconductors, biomaterials, and other organic and inorganic materials requiring UV-Vis spectroscopic characterization.

Micromeritics ASAP 2020 Plus Physisorption Analyzer (BET)

The Micromeritics ASAP 2020 Plus Physisorption Analyzer provides quantitative characterization of the surface area and pore structure of porous and particulate materials through gas adsorption measurements. The system can be used to determine specific surface area using BET and Langmuir methods, as well as pore volume and pore-size distribution using a variety of adsorption models.

The instrument supports detailed adsorption and desorption isotherm measurements and data analysis using methods such as BJH, t-plot, and density functional theory (DFT). These capabilities enable characterization of micro- and mesoporous structures and provide insight into surface and pore properties that influence adsorption, catalytic activity, transport, and other material behaviors.

The ASAP 2020 Plus is well suited for catalysts, porous materials, powders, ceramics, nanoparticles, carbons, zeolites, battery materials, and other materials where surface area and porosity are important to performance.

Anton Paar Litesizer 700 Particle Analyzer - Dynamic Light Scattering (DLS) 

The Anton Paar Litesizer DLS 700 Particle Analyzer provides comprehensive characterization of particles and molecules dispersed in liquids using dynamic and electrophoretic light-scattering techniques. The system can be used to measure particle size, zeta potential, electrophoretic mobility, particle concentration, molecular mass, and transmittance, providing insight into particle behavior, dispersion stability, and aggregation.

The instrument supports both single-angle dynamic light scattering and Multi-Angle Particle Sizing (MAPS), enabling reliable particle-size analysis across a broad range of samples. Continuous transmittance monitoring provides additional information about sample turbidity and can help identify changes such as sedimentation or aggregation during measurement. The system also automatically optimizes measurement parameters such as detection angle, attenuation, focus, and measurement duration.

The Litesizer DLS 700 is well suited for nanoparticles, colloids, emulsions, polymers, proteins, biomaterials, and other particles or macromolecules dispersed in liquids. The MCC system supports particle-size measurements from approximately 0.3 nm to 10 μm, a zeta-potential measurement range exceeding ±1000 mV, and molecular-mass measurements from approximately 300 Da to 20 MDa.