Materials Characterization

Bruker D2 Phaser Powder X-ray Diffractometer (PXRD)

Structure Analysis
Phase Analysis

This benchtop device is used for quantitative phase analysis and crystal structure identification of a crystalline material. Nano-structure and crystallite size can be determined through small-angle x-ray scattering (SAXS) analysis.

ThermoFisher K-Alpha X-ray Photoelectron Spectroscopy (XPS)

Surface Analysis

The K-Alpha Spectrometer delivers much improved spectroscopic performance. This leap forward results in faster analysis times, improved element detection, and the possibility to acquire data at higher resolution yielding better chemical state identification.

Analytical options include a vacuum transfer module for moving air-sensitive samples from a glove box to the system, and the tilt module for ARXPS data collection. Equipped with the Thermo Scientific™ Avantage Data System, the complete surface analysis software system, the K-Alpha has a range of software features designed to optimize data interpretation, data reporting and usability. The K-Alpha XPS system meets the requirements of both experienced XPS analysts and newcomers to the technique, bringing together high performance, monochromated XPS and sputter depth profiling, with intelligent automation and intuitive control.

Park XE70 Atomic Force Microscopy (AFM) aka scanning force microscopy (SFM)

Surface Analysis

It commonly provides ultra high resolution topographical surface characterization. The image is obtained by the tip tapping on the surface of the sample. Therefore, it also available to study the electrical, magnetic, and mechanical properties of surfaces. 

Horiba Micro XploRA Raman Spectrometer

Optical Analysis
Structure Analysis

It is a non-destructive fingerprint chemical analysis technique which provides detailed information about chemical structure, phase and polymorphism, intrinsic stress/strain, crystallinity and molecular interactions. The measurement is based upon the interaction of light with the chemical bonds within a material.

Bruker Vertex 80v Fourier-Transform Infrared spectroscopy (FTIR)

Optical Analysis
Absorption Analysis
Structure Analysis

IR spectroscopy is based in the fact that molecules absorb specific frequencies that are characteristic of their structure. These absorptions are related to the strength of the bond. Owing the improvements of Fourier-Transform, FTIR turns into instant selective tool for a fingerprint of the substance. The ATR accessory is prepared for non-image measurements, which is very user friendly.

Micromeritics AutoChem II 2920 Chemisorption Analyzer

Surface Analysis
Absorption Analysis

Chemisorption is used in development, monitoring and measuring of corrosion inhibitors and is used for measuring surface active sites on a substrate. During the process the adsorbing gas or vapor molecule splits into atoms, radicals, ions that form a chemical bond with the adsorption site. A mass spec will be attached for in-situ analysis.

Typical Applications:

Fuel Cell / Catalytic Reforming:

• Metal surface area
• Metal dispersion
• Average crystallite size

Partial Oxidation:

• Temperature-programmed oxidation (TPO)
• Temperature-programmed desorption (TPD)
• Heat of desorption of oxygen
• Heat of dissociation of oxygen

Catalytic Cracking:

• Ammonia chemisorption
• TPD of ammonia
• TPD of alkyl amines
• TPD of aromatic amines

Isomerization / Hydrocracking / Fischer-Tropsch Synthesis :

• Temperature-programmed reduction (TPR)
• Pulse chemisorption
• TPD
   

NETZSCH Differential Scanning Calorimeter (DSC) 214 Polyma

Thermal Analysis
Phase Analysis

It precisely measures heat capacity, phase transition and oxidative stability of polymers or liquid crystals, which allows us to understand amorphous and crystalline behavior, polymorph and eutectic transitions, curing and degree of cure, and many other material properties. This device can heat at up to 500 K/min and cool at 200 K/min over a wide measurement range. 

NETZSCH Simultaneous Thermal Analysis (STA) 449 F1 Jupiter / Quadrupole Mass Spectrometer (QMS) 403

Thermal Analysis
Phase Analysis

STA refers to the simultaneous application of Thermogravimetry (TGA) and DSC to one and the same sample in a single instrument.  The tungsten heating element allows for measurements under helium atmosphere from room temperature to 2000°C and high-vacuum measurements from 400°C to 2000°C. The QMS is coupled for evolved gas analysis.

TA Instruments Discovery Dynamic Mechanical Analyzer (DMA) 850

Thermal Analysis
Mechanical Analysis
Phase Analysis

It is used to measure a material’s response (deformation) to a sinusoidal load under a given temperature and/or time.  Common physical properties characterized are glass transition, elasticity and viscosity of solid samples.

Agilent Cary 60 UV/VIS Spectrometer (UV-Vis) 

Optical Analysis
Structure Analysis

The Cary 60 UV-Vis spectrophotometer has a wavelength range of 190–1100 nm that can be scanned in under three seconds. Our flexible UV-Vis spectrophotometer can be fitted with long path length cuvettes and solid sample transmission accessories. It is ideal for remote UV-Vis absorbance analysis when equipped with fiber optic probes. The sample accessories include a cuvette solution sample holder, solid sample transmission holder and a fiber optic probe.