Scanning Electron Microscope

JEOL JSM-6340F Scanning Electron Microscope

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples.

Scanning Electron Microscope

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples.

  • Resolution: 1.2nm
  • Accelerating Voltage: 0.5-20keV
  • Stage: X=50mm; Y=70mm, Z=25mm
  • Tilt Angle: -5º to +45º
  • Rotation: 360º Endless
  • Energy Dispersive X-ray Spectrometer (EDS)

SEM Facility User Rates (Per Hour)

 

External Commercial
(profit)
External Academic
(non-profit)

Internal

 

Facility  Operator

Self  Operator

Facility  Operator

Self Operator

Facility Operator

Self Operator

SEM

$200

$100

$130

$30

$120

$20


The microscope is located in Higgins 110. For all microscope questions and training, please contact: Bret Judson.

Please note that all work performed in BC core facilities and recharge centers should always be appropriately acknowledged.  If you are publishing or presenting data acquired in BC core facilities and recharge centers, please include the following statement in the Acknowledgement section of your manuscript/poster/presentation, "The authors would like to thank the Boston College <insert facility name> for assistance with the work presented in this paper/poster/presentation*."
* Delete as appropriate