Scanning Electron Microscope

JEOL JSM-6340F Scanning Electron Microscope

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples.

Scanning Electron Microscope

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples.

  • Resolution: 1.2nm
  • Accelerating Voltage: 0.5-20keV
  • Stage: X=50mm; Y=70mm, Z=25mm
  • Tilt Angle: -5º to +45º
  • Rotation: 360º Endless
  • Energy Dispersive X-ray Spectrometer (EDS)

SEM Facility User Rates (Per Hour)

 

External Commercial
(profit)
External Academic
(non-profit)

Internal

 

Facility  Operator

Self  Operator

Facility  Operator

Self Operator

Facility Operator

Self Operator

SEM

$200

$100

$130

$30

$120

$20


The microscope is located in Higgins 110. For all microscope questions and training, please contact: Bret Judson.