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Scanning Electron Microscope

electron microscope facility at boston college

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This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples. 

  • Resolution: 1.2nm
  • Accelerating Voltage: 0.5-20keV
  • Stage: X=50mm; Y=70mm, Z=25mm
  • Tilt Angle: -5º to +45º
  • Rotation: 360º Endless
  • Energy Dispersive X-ray Spectrometer (EDS)
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